منابع مشابه
pattern recognition in maintenance data using methodologies data minitng (cade study isfahan regional power electric company)
فعالیت های نگهداری و تعمیرات اطلاعاتی را تولید می کند که می تواند در تعیین زمان های بیکاری و ارایه یک برنامه زمان بندی شده یا تعیین هشدارهای خرابی به پرسنل نگهداری و تعمیرات کمک کند. وقتی که مقدار داده های تولید شده زیاد باشند، فهم بین متغیرها بسیار مشکل می شوند. این پایان نامه به کاربردی از داده کاوی برای کاوش پایگاه های داده چندبعدی در حوزه نگهداری و تعمیرات، برای پیدا کردن خرابی هایی که موجب...
15 صفحه اولLayout-aware Low Power Test Pattern Generation
A new test pattern generation method for low power test is presented. The proposed method is based on the scan chain configuration after Place and Route (P&R) process. It is also based on the Weighted Transition Metric(WTM) for low power test pattern generation. It does not need to modify any design process and very easy to run. The experimental results of ISCAS 89’ benchmark circuits show the ...
متن کاملLow-Power Transition-Delay Fault Pattern Generation
As modern technologies continue to scale the supply voltage to reduce power consumption, the noise tolerance of these designs also decrease. Testing these designs with conventional transition delay fault patterns can easily strain the power distribution network of the chip beyond the intended design specification due to higher-than-average functional switching activity and the lower noise toler...
متن کاملThe Compression Power of Symbolic Pattern Databases
The heuristics used for planning and search often take the form of pattern databases generated from abstracted versions of the given state space. Pattern databases are typically stored as lookup tables with one entry for each state in the abstract space, which limits the size of the abstract state space and therefore the quality of the heuristic that can be used with a given amount of memory. I...
متن کاملLow Power Transition Delay Fault Pattern Generation
This paper describes a low-power test generation procedure, which targets the switching activity during the fast functional clock cycles of broadside tests. The procedure is based on merging of test cubes that it extracts from functional broadside tests. The use of test cube merging supports test compaction and it can be used for accommodating the constraints of test data compression. The use o...
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ژورنال
عنوان ژورنال: Nature Nanotechnology
سال: 2007
ISSN: 1748-3387,1748-3395
DOI: 10.1038/nnano.2007.238